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Beilstein J. Nanotechnol. 2018, 9, 2032–2039, doi:10.3762/bjnano.9.192
Figure 1: The standard probe pin configurations A, A’, B and B’ used in the experiments.
Figure 2: The three sub-probes on an M7PP used for multiplexing during measurements; a) 1357 (20 μm pitch), b...
Figure 3: The dashed curves show the relative Hall signal ΔRBB′/RH = f(ζ) (Equation 1) and relative pseudo sheet resist...
Figure 4: Static position errors: at the top, the ideal positions of a M7PP is shown. Below, the case of only...
Figure 5: Effective sensitivity for a) R0, b) NHS and c) μH when in- and off-line errors are present during ...
Figure 6: Effective sensitivity for the sheet resistance, Hall mobility and Hall sheet carrier density, due ...
Figure 7: Generalization of Figure 6. The sensitivity of each parameter, a) Sheet resistance R0, b) Sheet carrier den...
Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178
Figure 1: Top-view schematic of the four μ4pp electrodes landed on (a) a single fin and (b) two fins. The ele...
Figure 2: (a) Measured fin resistance Rfin as a function of fin width Wfin on isolated (triangle) and dense (...
Figure 3: (a) TEM image of four ca. 20 nm wide Si fins where the measured Rfin is indicated on top of each fi...